JPH0324068B2 - - Google Patents

Info

Publication number
JPH0324068B2
JPH0324068B2 JP56138831A JP13883181A JPH0324068B2 JP H0324068 B2 JPH0324068 B2 JP H0324068B2 JP 56138831 A JP56138831 A JP 56138831A JP 13883181 A JP13883181 A JP 13883181A JP H0324068 B2 JPH0324068 B2 JP H0324068B2
Authority
JP
Japan
Prior art keywords
substrate
region
silicon layer
regions
element isolation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56138831A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5840851A (ja
Inventor
Satoru Maeda
Hiroshi Iwai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56138831A priority Critical patent/JPS5840851A/ja
Priority to US06/307,877 priority patent/US4560421A/en
Publication of JPS5840851A publication Critical patent/JPS5840851A/ja
Publication of JPH0324068B2 publication Critical patent/JPH0324068B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76294Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using selective deposition of single crystal silicon, i.e. SEG techniques
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/02373Group 14 semiconducting materials
    • H01L21/02381Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02636Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
    • H01L21/02639Preparation of substrate for selective deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/112Constructional design considerations for preventing surface leakage or controlling electric field concentration for preventing surface leakage due to surface inversion layers, e.g. by using channel stoppers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
JP56138831A 1980-10-02 1981-09-03 相補型mos半導体装置及びその製造方法 Granted JPS5840851A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP56138831A JPS5840851A (ja) 1981-09-03 1981-09-03 相補型mos半導体装置及びその製造方法
US06/307,877 US4560421A (en) 1980-10-02 1981-10-02 Semiconductor device and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56138831A JPS5840851A (ja) 1981-09-03 1981-09-03 相補型mos半導体装置及びその製造方法

Publications (2)

Publication Number Publication Date
JPS5840851A JPS5840851A (ja) 1983-03-09
JPH0324068B2 true JPH0324068B2 (en]) 1991-04-02

Family

ID=15231235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56138831A Granted JPS5840851A (ja) 1980-10-02 1981-09-03 相補型mos半導体装置及びその製造方法

Country Status (1)

Country Link
JP (1) JPS5840851A (en])

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6030169A (ja) * 1983-07-29 1985-02-15 Toshiba Corp 相補型mos半導体装置及びその製造方法
JPS6074664A (ja) * 1983-09-30 1985-04-26 Toshiba Corp 相補型mos半導体装置の製造方法
JPS6074564A (ja) * 1983-09-30 1985-04-26 Toshiba Corp 半導体記憶装置
JPS6089957A (ja) * 1983-10-24 1985-05-20 Nippon Telegr & Teleph Corp <Ntt> 相補形半導体装置
JPS6239047A (ja) * 1985-08-13 1987-02-20 Toppan Printing Co Ltd Cmos型集積回路素子
JP2533160Y2 (ja) * 1992-06-17 1997-04-23 小松ゼノア株式会社 気化器のカバー

Also Published As

Publication number Publication date
JPS5840851A (ja) 1983-03-09

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